Hi.
I'm looking at setting up a system which will be used to test a number of ATA133 EIDE 250MB Western Digital Hard drives.
The BIT software has been recommended, to do a test of the full drive capacity using the High Low frequency data overwrite pattern. What drive characteristic does this pattern test?
Ideally the system should be capable of running as many drives at one time as possible to maximise the output. If the total test time must be lower than 20 hrs is it possible to estimate the quantity of drives which could be tested in this manner by one PC system ?
Other than the drive response, what would be the primary limiting factors on the speed of testing possible, PC CPU speed, Ram size, the controller which implements EIDE channel, Operating System ..etc?
By adding additional drives to the system will this cause a linear reduction in the testing speed for each drive added?
Is there an optimal number of drives which would give best return for time spent testing?
Would the organisation of the drives in OS, or on EIDE channels (Primary V Secondary) have any effect on speed?
Thanks in advance
I'm looking at setting up a system which will be used to test a number of ATA133 EIDE 250MB Western Digital Hard drives.
The BIT software has been recommended, to do a test of the full drive capacity using the High Low frequency data overwrite pattern. What drive characteristic does this pattern test?
Ideally the system should be capable of running as many drives at one time as possible to maximise the output. If the total test time must be lower than 20 hrs is it possible to estimate the quantity of drives which could be tested in this manner by one PC system ?
Other than the drive response, what would be the primary limiting factors on the speed of testing possible, PC CPU speed, Ram size, the controller which implements EIDE channel, Operating System ..etc?
By adding additional drives to the system will this cause a linear reduction in the testing speed for each drive added?
Is there an optimal number of drives which would give best return for time spent testing?
Would the organisation of the drives in OS, or on EIDE channels (Primary V Secondary) have any effect on speed?
Thanks in advance
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