Dear Passmark,
My system-under-test has both spinning hard disks and SD cards. These get lumped in BIT into one category called "Disk." I want to know if I can make the SD card tests less intense than the hard disk tests. This would better reflect real-world usage. The duty cycle adjustment for Disks seems to apply equally to hard disks and SD cards.
I did research Seek Count and Duty Cycle Override, but those variables don't seem to be what I'm looking for. Please let me know if I can adjust test intensity between SD cards and hard disks separately. Thanks.
-shadow
My system-under-test has both spinning hard disks and SD cards. These get lumped in BIT into one category called "Disk." I want to know if I can make the SD card tests less intense than the hard disk tests. This would better reflect real-world usage. The duty cycle adjustment for Disks seems to apply equally to hard disks and SD cards.
I did research Seek Count and Duty Cycle Override, but those variables don't seem to be what I'm looking for. Please let me know if I can adjust test intensity between SD cards and hard disks separately. Thanks.
-shadow
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